The study of voids in the AuAl thin-film system using the nuclear microprobe-Reference-Cited by-同舟云学术

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The study of voids in the AuAl thin-film system using the nuclear microprobe

Published:1997-07 Issue:1-4 Volume:130 Page:722-727
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

de Waal H.S.,Pretorius R.,Prozesky V.M.,Churms C.L.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference9 articles.

1. Void formation in thin Al films

2. A review of thin film aluminide formation;Colgan,1990

3. The NAC nuclear microprobe facility

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Void and cavity determination in micro-PIXE analysis of composed material using binocular detectors: A computational study;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-08

2. Interface transformations in thin film aluminum–gold diffusion couples;Thin Solid Films;2007-05

3. Sputter-deposited Al–Au coatings;Intermetallics;2004-05

4. Sputtered Coatings Based on the Al2Au Phase;MRS Proceedings;2004

5. Lateral diffusion study of the Pt–Al system using the NAC nuclear microprobe;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-09

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