Ar+ ion milling-induced suppression of surface oxidation in Fe70Co30 thin films
Author:
Publisher
Elsevier BV
Subject
Condensed Matter Physics,General Materials Science
Reference17 articles.
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1. Development of sub-nanometer resolution depth-resolved XAFS/XMCD in the soft x-ray region towards operando measurements;AIP Conference Proceedings;2019
2. Development of high signal-to-background ratio depth-resolved soft X-ray absorption spectroscopy by fluorescence energy selection;Japanese Journal of Applied Physics;2018-10-30
3. Nanometer-resolution depth-resolved measurement of florescence-yield soft x-ray absorption spectroscopy for FeCo thin film;Review of Scientific Instruments;2017-08
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