Dielectric relaxation and Hopping conduction mechanism in Ni1-xSrxO nanostructures-Reference-Cited by-同舟云学术

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Dielectric relaxation and Hopping conduction mechanism in Ni1-xSrxO nanostructures

Published:2020-01 Issue: Volume:239 Page:121959
ISSN:0254-0584
Container-title:Materials Chemistry and Physics
language:en
Short-container-title:Materials Chemistry and Physics

Author:

Siddique M. Naseem,Ahmed Ateeq,Tripathi P.

Funder

University Grants Commission

Junior Research Fellowship

Department of Applied Physics, AMU, Aligarh, India

Publisher

Elsevier BV

Subject

Condensed Matter Physics,General Materials Science

Reference71 articles.

1. Determination of density of states, conduction mechanisms and dielectric properties of nickel disulfide nanoparticles

2. Realizing NiO nanocrystals from a simple chemical method

3. Electrochemical study of NiO nanoparticles electrode for application in rechargeable lithium-ion batteries

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