Effects of the carbon-to-nitrogen ratio on the microstructure and properties of (CrNbSiTiZr)C N high-entropy carbonitride films
Author:
Funder
Ministry of Science and Technology, Taiwan
Publisher
Elsevier BV
Subject
Condensed Matter Physics,General Materials Science
Reference51 articles.
1. Dry sliding wear of TiN based ternary PVD coatings;Vancoille;Wear,1993
2. TiC coatings prepared by pulsed laser deposition and magnetron sputtering;Tang;Surf. Coating. Technol.,1997
3. The improved corrosion resistance of sputtered CrN thin films with Cr-ion bombardment layer by layer;Wang;Vacuum,2017
4. Fretting wear analysis of TiC/VC multilayered hard coatings: experiments and modelling approaches;Fouvry;Wear,2004
5. Mechanical properties of TiN-TiC mixed crystal films;Hyakutake;J. Phys. Condens. Matter,1998
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