Characteristics of SiOx-containing hard film prepared by low temperature plasma enhanced chemical vapor deposition using hexamethyldisilazane or vinyltrimethylsilane and post oxygen plasma treatment
Author:
Funder
Ministry of Science and Technology
Publisher
Elsevier BV
Subject
Condensed Matter Physics,General Materials Science
Reference29 articles.
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5. Properties of SiO2-like barrier layers on polyethersulfone substrates by low-temperature plasma-enhanced chemical vapor deposition;Wuu;Thin Solid Films,2004
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