Funder
National Science Foundation
Reference101 articles.
1. Ryan Gabrys, Eitan Yaakobi, Laura M. Grupp, Steven Swanson, Lara Dolecek, Tackling intracell variability in TLC Flash through tensor product codes, in: 2012 IEEE International Symposium on Information Theory Proceedings, 2012.
2. Yu Cai, Erich F. Haratsch, Onur Mutlu, Ken Mai, Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis, in: Proceedings of the Conference on Design, Automation and Test in Europe, DATE, 2012.
3. Laura M. Grupp, Adrian M. Caulfield, Joel Coburn, Steven Swanson, Eitan Yaakobi, Paul H. Siegel, Jack K. Wolf, Characterizing flash memory: anomalies, observations, and applications, in: Proceedings of the 42nd Annual IEEE/ACM International Symposium on Microarchitecture, MICRO, 2009.
4. The impact of random telegraph signals on the scaling of multilevel flash memories;Kurata,2006
5. Hanmant P Belgal, Nick Righos, Ivan Kalastirsky, Jeff J Peterson, Robert Shiner, Neal Mielke, A new reliability model for post-cycling charge retention of flash memories, in: Proceedings of the 40th Annual Reliability Physics Symposium, 2002.
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