Parametrization of free ion levels of four isoelectronic 4f2 systems: Insights into configuration interaction parameters-Reference-Cited by-同舟云学术

Parametrization of free ion levels of four isoelectronic 4f2 systems: Insights into configuration interaction parameters

Published:2013-12 Issue: Volume:590 Page:46-51
ISSN:0009-2614
Container-title:Chemical Physics Letters
language:en
Short-container-title:Chemical Physics Letters

Author:

Yeung Yau Yuen,Tanner Peter A.

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy

Reference23 articles.

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5. A few mistakes in widely used data files for configurations calculations

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