FTIR spectroscopic measurements of surface bond products of nitrogen oxides on aerosol surfaces—implications for heterogeneous HNO2 production
Author:
Publisher
Elsevier BV
Subject
General Earth and Planetary Sciences,General Environmental Science
Reference20 articles.
1. Photo-enhancement of the nitrous acid formation in the surface reaction of nitrogen dioxide and water vapor: extra radical source in smog chamber experiments;Akimoto;Int. J. chem. Kinet.,1987
2. The equilibrium constant for N2O5 ⇔ NO2 + NO3: absolute determination by direct measurement from 243 to 397 K;Cantrell;J. chem. Phys.,1988
3. Infrared absorption cross sections for N2O5;Cantrell;Chem. Phys. Lett.,1988
4. Infrared studies of the disproportionation reaction of nitric oxide on Y-type zeolites;Chao;J. Am. Chem. Soc.,1971
5. Infrared spectra of isotopically substituted nitro-, nitrito-, and nitrosyl complexes;Cleare;J. Chem. Soc. A,1967
Cited by 56 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Recent progress in aging studies of a eutectic mixture of bis(2,2-dinitropropyl) acetal and formal nitroplasticizer;Polymer Degradation and Stability;2023-12
2. Initial uptake of NO2 on methane flame soot;Russian Journal of Physical Chemistry B;2015-03
3. Pseudo steady states of HONO measured in the nocturnal marine boundary layer: a conceptual model for HONO formation on aqueous surfaces;Atmospheric Chemistry and Physics;2011-04-05
4. Pseudo steady states of HONO measured in the nocturnal marine boundary layer: a conceptual model for HONO formation on aqueous surfaces;2010-10-27
5. Heterogeneous reaction of NO2 on the surface of NaCl particles;Science in China Series B: Chemistry;2006-08
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3