Author:
Shimizu K,Brown G.M,Habazaki H,Kobayashi K,Skeldon P,Thompson G.E,Wood G.C
Subject
General Materials Science,General Chemical Engineering,General Chemistry
Reference11 articles.
1. Surface films formed on aluminum by different pretreatments. I. XPS analysis of thickness and chemical composition.
2. K. Shimizu, G.M. Brown, K. Kobayashi, P. Skeldon, G.E. Thompson, G.C. Wood, Corros. Sci. (in press).
3. The Use of Rutherford Backscattering to Study the Behavior of Ion-Implanted Atoms During Anodic Oxidation of Aluminum: Ar, Kr, Xe, K, Rb, Cs, Cl, Br, and l
4. The migration of Cl− and I− ions in anodic alumina
5. An atomic force microscopy study of the corrosion and filming behaviour of aluminium
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11 articles.
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