Thermal probe self-calibration in ac scanning thermal microscopy-Reference-Cited by-同舟云学术

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Thermal probe self-calibration in ac scanning thermal microscopy

Published:2004-03 Issue:3-6 Volume:35 Page:305-314
ISSN:0749-6036
Container-title:Superlattices and Microstructures
language:en
Short-container-title:Superlattices and Microstructures

Author:

Chirtoc M.,Filip X.,Henry J.F.,Antoniow J.S.,Chirtoc I.,Dietzel D.,Meckenstock R.,Pelzl J.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science

Reference8 articles.

1. Proc. Microsc. Semicond. Mater. Conf. 95;Balk,1996

2. D.C. scanning thermal microscopy: Characterisation and interpretation of the measurement

3. A.C. scanning thermal microscopy: Tip–sample interaction and buried defects modellings

4. Wide‐frequency specific heat spectrometer

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