Temperature dependent optical properties of ZnO thin film using ellipsometry and photoluminescence-Reference-Cited by-同舟云学术

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Temperature dependent optical properties of ZnO thin film using ellipsometry and photoluminescence

Published:2018-05 Issue: Volume:117 Page:457-468
ISSN:0749-6036
Container-title:Superlattices and Microstructures
language:en
Short-container-title:Superlattices and Microstructures

Author:

Bouzourâa M.-B.,Battie Y.,Dalmasso S.,Zaïbi M.-A.,Oueslati M.,En Naciri A.

Funder

Pascal Franchetti

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science

Reference48 articles.

1. A comprehensive review of ZnO materials and devices

2. Structural and optical characterization of ZnO thin films for optoelectronic device applications by RF sputtering technique

3. Morphological driven photocatalytic activity of ZnO nanostructures

4. Semiconductor Gas Sensors;Joaniso,2013

5. Plasmonic enhancement of UV emission from ZnO thin films induced by Al nano-concave arrays

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