A method of mapping defects in thin foils-Reference-Cited by-同舟云学术

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A method of mapping defects in thin foils

Published:1972-01 Issue:3 Volume:4 Page:333-342
ISSN:0047-7206
Container-title:Micron (1969)
language:en
Short-container-title:Micron (1969)

Author:

Malis T.,Lloyd D.J.,Tangri K.

Publisher

Elsevier BV

Subject

Structural Biology,Cell Biology

Reference6 articles.

1. Specimen preparation techniques;Hirsch,1965

2. Applications of the dynamical theory to crystals containing dislocations;Hirsch,1965

3. The effect of quench aging on inhomogeneous yielding of steels with very low interstitial solute content;Hook;Met. Trans.,1970

4. Dislocation generation from grain boundaries in nickel;Malis;Phys. Stat. Sol.,1972

5. Stacking fault propagation from a coherent twin boundary;Malis;Phil. Mag.,1972

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Reduction of spurious deformation in electron microscope thin foils;Journal of Physics E: Scientific Instruments;1976-02

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