Chapter 4 Hot carrier injections in SIO2 and related instabilities in submicrometer mosfets
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Published:1999
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Page:265-339
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ISSN:1874-5903
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Container-title:New Insulators, Devices and Radiation Effects
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language:
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1. Channel Hot Carriers and Other Reliability Mechanisms;Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications;2013-10-19