High resolution surface scanning of Thick-GEM for single photo-electron detection-Reference-Cited by-同舟云学术

High resolution surface scanning of Thick-GEM for single photo-electron detection

Published:2012-12 Issue: Volume:694 Page:16-23
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Hamar G.,Varga D.

Funder

Hungarian NFÜ OTKA/KTIA

OTKA

NFÜ

János Bolyai Research Scholarship of the Hungarian Academy of Sciences

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference14 articles.

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. MPGD hole-by-hole gain scanning by UV excited single photoelectron detection;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2020-04

4. Investigation of the properties of Thick-GEM photocathodes by microscopic scale measurements with single photo-electrons;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2017-12

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