EDET DH80k - characterization of a DePFET based sensor for TEM direct electron imaging-Reference-Cited by-同舟云学术

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EDET DH80k - characterization of a DePFET based sensor for TEM direct electron imaging

Published:2020-04 Issue: Volume:958 Page:162544
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Predikaka Mitja,Bähr Alexander,Koffmane Christian,Ninković Jelena,Prinker Eduard,Richter Rainer,Treis Johannes,Wassatsch Andreas

Funder

Max-Planck-Gesellschaft

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference11 articles.

1. Electronic detectors for electron microscopy

2. Characterization and optimization of a thin direct electron detector for fast imaging applications

3. Processing of ultra-thin silicon sensors for future e/sup +/e/sup -/ linear collider experiments

4. New detector concepts

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Novel sensor developments for photon science at the MPG semiconductor laboratory;Frontiers in Physics;2024-01-23

2. DePFET—Recent Developments and Future Prospects;Frontiers in Physics;2022-06-03

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