Optical inspection of the silicon micro-strip sensors for the CBM experiment employing artificial intelligence-Reference-Cited by-同舟云学术

Optical inspection of the silicon micro-strip sensors for the CBM experiment employing artificial intelligence

Published:2022-01 Issue: Volume:1021 Page:165932
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Lavrik E.,Shiroya M.,Schmidt H.R.,Toia A.,Heuser J.M.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference17 articles.

1. Advanced methods for the optical quality assurance of silicon sensors;Lavrik;Nucl. Instrum. Methods A,2019

2. Technical Design Report for the CBM Silicon Tracking System;Heuser,2013

3. P. Senger, et al. CBM Progress Report 2019, CBM-PR-2019, http://dx.doi.org/10.15120/GSI-2020-00904.

4. A custom probe station for microstrip detector quality assurance of the CBM experiment;Panasenko1;J. Phys. Conf. Ser.,2016

5. The ATLAS Collaboration, The technical design report for the ATLAS inner tracker strip detector CERN-LHCC-2017-005, https://cds.cern.ch/record/2257755/files/ATLAS-TDR-025.pdf.

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