The application of encoder–decoder neural networks in high accuracy and efficiency slit-scan emittance measurements-Reference-Cited by-同舟云学术

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The application of encoder–decoder neural networks in high accuracy and efficiency slit-scan emittance measurements

Published:2023-05 Issue: Volume:1050 Page:168125
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Ma S.^ORCID,Arnold A.,Michel P.,Murcek P.,Ryzhov A.,Schaber J.,Steinbrück R.,Evtushenko P.,Teichert J.,Hillert W.^ORCID,Xiang R.,Zhu J.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference27 articles.

1. An engineering guide to photoinjectors;Rao,2014

2. Ultrafast X-ray pulse characterization at free-electron lasers;Grguraš;Nat. Photonics,2012

3. Overview of options for generating high-brightness attosecond x-ray pulses at free-electron lasers and applications at the European XFEL;Serkez;J. Opt.,2018

4. X-ray free-electron lasers: From dreams to reality;Pellegrini;Phys. Scr.,2017

5. Energy recovery linacs, synchrotron light sources and free-electron lasers: Accelerator physics;Merminga;Instrum. Sci. Appl.,2020

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Applying fully convolutional networks for beam profile and emittance measurements;Journal of Instrumentation;2023-10-01

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