Analysis of noise characteristics for the active pixels in CMOS image sensors for X-ray imaging
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference11 articles.
1. Test structures for characterization and comparative analysis of CMOS image sensors
2. CMOS image sensors: electronic camera-on-a-chip
3. CMOS active pixel image sensors
4. CMOS active pixel image sensors for highly integrated imaging systems
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Dimension dependent immunity of X-ray irradiation on low-temperature polycrystalline-silicon TFTs;Japanese Journal of Applied Physics;2017-05-02
2. Analysis of noise in CMOS image sensor based on a unified time-dependent approach;Solid-State Electronics;2010-01
3. Optimization of CMOS active pixels with high signal-to-noise ratio for high-resolution X-ray imaging;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2008-06
4. Development and characterization of CMOS-based monolithic X-ray imager sensor;2007 IEEE Nuclear Science Symposium Conference Record;2007
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