Deep n-well MAPS in a 130nm CMOS technology: Beam test results-Reference-Cited by-同舟云学术

Deep n-well MAPS in a 130nm CMOS technology: Beam test results

Published:2010-11 Issue:1 Volume:623 Page:195-197
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Neri N.,Avanzini C.,Batignani G.,Bettarini S.,Bosi F.,Ceccanti M.,Cenci R.,Cervelli A.,Crescioli F.,Dell’Orso M.,Forti F.,Giannetti P.,Giorgi M.A.,Gregucci S.,Mammini P.,Marchiori G.,Massa M.,Morsani F.,Paoloni E.,Piendibene M.,Profeti A.,Rizzo G.,Sartori L.,Walsh J.,Yurtsev E.,Lusiani A.,Manghisoni M.,Re V.,Traversi G.,Bruschi M.,Di Sipio R.,Fabbri L.,Giacobbe B.,Gabrielli A.,Giorgi F.,Pellegrini G.,Sbarra C.,Semprini N.,Spighi R.,Valentinetti S.,Villa M.,Zoccoli A.,Andreoli C.,Gaioni L.,Pozzati E.,Ratti L.,Speziali V.,Gamba D.,Giraudo G.,Mereu P.,Dalla Betta G.F.,Soncini G.,Fontana G.,Bomben M.,Bosisio L.,Cristaudo P.,Giacomini G.,Iugovaz D.,Lanceri L.,Rashevskaya I.,Vitale L.,Venier G.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

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1. Fast Readout Architectures for Large Arrays of Digital Pixels: Examples and Applications;The Scientific World Journal;2014

2. The first fully functional 3D CMOS chip with Deep N-well active pixel sensors for the ILC vertex detector;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2013-12

3. R&D paths of pixel detectors for vertex tracking and radiation imaging;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2013-07

4. Electron Interference via a 4096-Pixel MAPS Detector Designed for High-Energy Physics Experiments;IEEE Transactions on Nuclear Science;2013-04

5. Recent progress in the development of 3D deep n-well CMOS MAPS;Journal of Instrumentation;2012-02-06