Dependence of self-absorption on thickness for thin and thick alpha-particle sources of UO2-Reference-Cited by-同舟云学术

Dependence of self-absorption on thickness for thin and thick alpha-particle sources of UO2

Published:2005-08 Issue:3 Volume:548 Page:432-438
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Jurado Vargas M.,Fernández Timón A.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference16 articles.

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5. T.M. Semkow, H.W. Jeter, B. Parsa, P.P. Parekh, D.K. Haines, A. Bari, Nucl. Instr. and Meth. A, in press.

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