Radiation hardness of GaAs: Cr and Si sensors irradiated by electron beam

Author:

Kruchonak U.,El-Azm S. Abou,Afanaciev K.,Chelkov G.,Demichev M.,Gostkin M.,Guskov A.,Firu E.,Kobets V.,Leyva A.,Nozdrin A.,Porokhovoy S.,Sheremetyeva A.,Smolyanskiy P.,Torres A.,Tyazhev A.,Tolbanov O.,Zamyatin N.,Zarubin A.,Zhemchugov A.

Funder

BMBF-JINR program

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference21 articles.

1. M. Moll, Radiation Damage in Silicon Particle Detector, Ph.D. thesis, Hamburg, 1999, https://mmoll.web.cern.ch/mmoll/thesis/.

2. C. Claeys, E. Simoen, Radiation Effects in Advanced Semiconductor Material and Devices, ISBN 978-3-662-04974-7.

3. Chromium compensated gallium arsenide detectors for X-ray and gamma-ray spectroscopic imaging;Veale;Nucl. Instrum. Methods Phys. Res. A,2014

4. New materials for radiation hard semiconductor dectectors;Sellin;Nucl. Instrum. Methods Phys. Res. A,2006

5. GaAs radiation imaging detectors with an active layer thickness up to 1mm;Tyazhev;Nucl. Instrum. Methods Phys. Res. A,2003

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