An analog cell to detect single event transients in voltage references-Reference-Cited by-同舟云学术

An analog cell to detect single event transients in voltage references

Published:2015-01 Issue: Volume:770 Page:135-140
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Franco F.J.^ORCID,Palomar C.,Izquierdo J.G.,Agapito J.A.

Funder

MCINN projects

Consolider SAUUL

MCINN

UCM-BSCH

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference23 articles.

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3. A Comprehensive Methodology to Rate SETs of Complex Analog and Mixed-Signal Circuits Demonstrated on 16-bit A-to-D Converters

4. Detection and Correction Methods for Single Event Effects in Analog to Digital Converters

5. Investigation and Mitigation of Analog SET on a Bandgap Reference in Triple-Well CMOS Using Pulsed Laser Techniques

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1. Pulse quenching based radiation-hardened by design technique for analog single-event transient mitigation on an operational amplifier in 28 nm bulk CMOS process;Semiconductor Science and Technology;2020-06-18

2. Pulse Quenching and Charge-Sharing Effects on Heavy-Ion Microbeam Induced ASET in a Full-Custom CMOS OpAmp;IEEE Transactions on Nuclear Science;2019-07

3. SPICE Simulations of Single Event Transients in Bipolar Analog Integrated Circuits Using Public Information and Free Open Source Tools;IEEE Transactions on Nuclear Science;2015-08