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Dynamic X-ray direct conversion detector using a CdTe polycrystalline layer coupled to a CMOS readout chip

  • Published:2011-05 Issue: Volume:633 Page:S55-S58
  • ISSN:0168-9002
  • Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
  • language:en
  • Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Arques Marc,Renet Sébastien,Brambilla Andréa,Feuillet Guy,Gasse Adrien,Billon-Pierron Nicolas,Jolliot Muriel,Mathieu Lydie,Rohr Pierre

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Bragg Diffraction Imaging of CdZnTe Single Crystals;Journal of Electronic Materials;2020-05-29

2. Amorphous lead oxide (a-PbO): suppression of signal lag via engineering of the layer structure;Scientific Reports;2017-10-16

3. Structural and electrical properties of polycrystalline CdTe films for direct X-ray imaging detectors;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2013-12

4. Effects of Dislocation Walls on Image Quality When Using Cadmium Telluride X-Ray Detectors;IEEE Transactions on Nuclear Science;2013-02
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