Single Event Upset Analysis: On-orbit performance of the Alpha Magnetic Spectrometer Digital Signal Processor Memory aboard the International Space Station-Reference-Cited by-同舟云学术

Single Event Upset Analysis: On-orbit performance of the Alpha Magnetic Spectrometer Digital Signal Processor Memory aboard the International Space Station

Published:2018-03 Issue: Volume:885 Page:98-104
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Li Jiaqiang,Choutko Vitaly,Xiao Liyi

Funder

China Scholarship CouncilChina Scholarship Council (CSC)

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference8 articles.

1. First Result from the Alpha Magnetic Spectrometer on the International Space Station: Precision Measurement of the Positron Fraction in Primary Cosmic Rays of 0.5–350 GeV

2. THE ALPHA MAGNETIC SPECTROMETER ON THE INTERNATIONAL SPACE STATION

3. The Alpha Magnetic Spectrometer on the International Space Station

4. A. Lebedev, The AMS-02 electronics system, in: International Cosmic Ray Conference, Pune, India, vol. 3, 2005, pp. 377.

5. M. Menichelli et al., SEE tests for commercial off-the shelf DSPs to be used in a space experiment, in: 2011 IEEE Radiation Effects Data Workshop, Vancouver, BC, 2001, pp. 51–56.

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Method of solving single-event upset for heterogeneous dual field programmable logic gate array for infrared remote sensing camera in orbit;Journal of Applied Remote Sensing;2023-04-08

2. Monitor of the single event upsets and linear energy transfer of space radiation on the Beidou navigation satellites;Open Astronomy;2023-01-01

3. Application of Information Processing System Based on DSP in Electronic Information Engineering;Journal of Physics: Conference Series;2022-02-01

4. A Fault Injection Platform Supporting Both SEU and Multiple SEUs for SRAM-Based FPGA;IEEE Transactions on Device and Materials Reliability;2018-12

5. A fast fault injection platform of multiple SEUs for SRAM-based FPGAs;Microelectronics Reliability;2018-03