Measurement and investigation of proton irradiation-induced charge transfer inefficiency in PPD CIS at different integration times-Reference-Cited by-同舟云学术

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Measurement and investigation of proton irradiation-induced charge transfer inefficiency in PPD CIS at different integration times

Published:2018-04 Issue: Volume:886 Page:134-139
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Xue Yuanyuan,Wang Zujun,Zhang Fengqi,Bian Jingying,Yao Zhibin,He Baoping,Liu Minbo,Sheng Jiangkun,Ma Wuying,Dong Guantao,Jin Junshan

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference21 articles.

1. A monolithic active pixel sensor for charged particle tracking and imaging using standard VLSI CMOS technology

2. Development of a high-speed camera system for neutron imaging at a pulsed neutron source

3. Simulations of the Temperature Dependence of the Charge Transfer Inefficiency in a High-Speed CCD

4. Proton-induced CCD charge transfer degradation at low-operating temperatures

5. Comparison of CCD damage due to 10- and 60-MeV protons

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1. 位移损伤诱发CMOS图像传感器电荷转移损失退化的理论模拟研究;Acta Optica Sinica;2022

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