Flux monitor diode radiation hardness testing-Reference-Cited by-同舟云学术

Flux monitor diode radiation hardness testing

Published:2011-10 Issue:1 Volume:652 Page:112-115
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Lombardi M.L.,Favalli A.,Goda J.M.,Ianakiev K.D.,Moss C.E.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference5 articles.

1. K.D. Ianakiev, et al., Progress in development of an advanced enrichment monitor based on transmission measurements with an X-Ray source and NaI(Tl) spectrometer, in: Proceedings of the 50th Annual INMM Meeting, Tucson, AZ, July 12–16, 2009.

2. Calculation of X-ray bremsstrahlung and characteristic line emission produced by a Maxwellian electron distribution

3. International Radiation Detectors, Inc., Absolute X-ray detectors. 〈www.ird-inc.com〉 (accessed June 15, 2010).

4. 〈https://mcnpx.lanl.gov〉 (accessed June 15, 2010).

5. A.H. Siedle, L. Adams, Handbook of Radiation Effects, second ed., Oxford University Press, 2002.

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