Characterization of Si pixel detectors of different thickness-Reference-Cited by-同舟云学术

Characterization of Si pixel detectors of different thickness

Published:2004-02 Issue:1-2 Volume:518 Page:418-420
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Bisogni M.G.,Boscardin M.,Dalla Betta G.F.,Delogu P.,Fantacci M.E.,Gregori P.,Linsalata S.,Novelli M.,Piemonte C.,Quattrocchi M.,Rosso V.,Stefanini A.,Zorzi N.,Zucca S.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference5 articles.

1. Performance of a 4096-pixel photon counting chip

2. http://medipix.web.cern.ch/MEDIPIX

3. Semiconductor pixel detectors for digital mammography

4. Evaluation of elemental and compound semiconductors for X-ray digital radiography

5. Experimental study of Compton scattering reduction in digital mammographic imaging

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