Computational simulation of an electrostatic aberration corrector for a low-voltage scanning electron microscope-Reference-Cited by-同舟云学术

Computational simulation of an electrostatic aberration corrector for a low-voltage scanning electron microscope

Published:2004-02 Issue:1-2 Volume:519 Page:42-48
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Baranova L.A,Read F.H,Cubric D

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference17 articles.

1. Handbook of Charged Particle Optics;Lencova,1997

3. C. Weissbacker, H. Rose, Optik 110 (Suppl. 8) (1999) 8.

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3. Notes and References;Principles of Electron Optics;2018

4. Multipole electrostatic system mathematical modeling;Vestnik of Saint Petersburg University. Applied Mathematics. Computer Science. Control Processes;2017

5. Calculations of time-of-flight aberrations in practical electrostatic electron lenses using the differential algebraic method;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2013-01