The first beam test of a monolithic particle pixel detector in high-voltage CMOS technology-Reference-Cited by-同舟云学术

The first beam test of a monolithic particle pixel detector in high-voltage CMOS technology

Published:2011-02 Issue:1 Volume:628 Page:287-291
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Perić I.,Takacs C.,Behr J.,Wagner F.M.,Fischer P.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference1 articles.

1. A novel monolithic pixelated particle detector implemented in high-voltage CMOS technology

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