Cross-check of ex-situ and in-situ metrology of a bendable temperature stabilized KB mirror-Reference-Cited by-同舟云学术

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Cross-check of ex-situ and in-situ metrology of a bendable temperature stabilized KB mirror

Published:2011-04 Issue:1 Volume:635 Page:S58-S63
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Yuan Sheng,Goldberg Kenneth A.,Yashchuk Valeriy V.,Celestre Richard,McKinney Wayne R.,Morrison Gregory,Macdougall James,Mochi Iacopo,Warwick Tony

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference24 articles.

1. The Nanometer Optical Component Measuring Machine: a new Sub-nm Topography Measuring Device for X-ray Optics at BESSY

2. Sub-microradian surface slope metrology with the ALS Developmental Long Trace Profiler

3. Surface temperature and distortion of optical elements exposed to high power synchrotron radiation beams (invited)

4. Thermal effects and mirror surface figure requirements for a diagnostic beamline at the advanced light source

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-ray interferometers Talbot and Talbot—Lau;Physics-Uspekhi;2022-12

2. X-ray grating interferometer for in situ and at-wavelength wavefront metrology;Journal of Synchrotron Radiation;2017-01-01

3. Design and implementation of precise x-ray metrology to control a 45-cm long x-ray deformable mirror;SPIE Proceedings;2016-09-09

4. X-ray metrology and performance of a 45-cm long x-ray deformable mirror;Review of Scientific Instruments;2016-05

5. Nanofocusing of X-ray free-electron lasers by grazing-incidence reflective optics;Journal of Synchrotron Radiation;2015-04-15

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