X-ray performance of a wafer-scale CMOS flat panel imager for applications in medical imaging and nondestructive testing-Reference-Cited by-同舟云学术

X-ray performance of a wafer-scale CMOS flat panel imager for applications in medical imaging and nondestructive testing

Published:2016-09 Issue: Volume:831 Page:404-409
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Cha Bo Kyung,Jeon Seongchae,Seo Chang-Woo

Funder

Korea Electrotechnology Research Institute (KERI)

Ministry of Knowledge Economy

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference10 articles.

1. G. Zentai, in: Proc. of the 2011 IEEE International Conference on Imaging Systems and Techniques (ITS), 2011, p. 194.

2. G. Zenta, R. Colbeth, in: Proc. of IEEE Int. Symp. Medical Measurements and Applications, 2012, p. 242.

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