Silicon photomultiplier characterization on board a satellite in Low Earth Orbit

Author:

Barella Mariano,Burroni Tomás Ignacio,Carsen Irina,Far Mónica,Ferreira Chase Tomás,Finazzi Lucas,Golmar Federico,Gomez Marlasca Fernando,Izraelevitch Federico,Levy Pablo,Sanca Gabriel

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference16 articles.

1. NASA: Definition of technology readiness levels. esto.nasa.gov/files/trl_definitions.pdf, visited on 20/11/19.

2. SENSE. https://www.sense-pro.org/documents/roadmap, visited on 10/11/19.

3. NASA: 2020 NASA Technology Taxonomy. https://techport.nasa.gov/view/taxonomy, visited on 20/11/19.

4. Response of the LAZIO-SiRad detector to low energy electrons;Bencardino,2005

5. Strontium Iodide Radiation Instrument (SIRI) – Early on-orbit results;Mitchell,2019

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1. Characterization of SiPM performance in a small satellite in low earth orbit using LabOSat-01;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2024-10

2. Total ionizing dose measurements in small satellites in LEO using LabOSat-01;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2024-07

3. Dark Current Degradation in SiPMs Along Full Orbits in LEO;2024 Argentine Conference on Electronics (CAE);2024-03-07

4. Study of Silicon Photomultipliers in Low Earth Orbit;2023 Argentine Conference on Electronics (CAE);2023-03-09

5. LabOSat-01: a payload for in-orbit device characterization;IEEE Embedded Systems Letters;2023

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