Author:
Friedl M.,Ackermann K.,Aihara H.,Aziz T.,Bergauer T.,Bozek A.,Campbell A.,Dingfelder J.,Drasal Z.,Frankenberger A.,Gadow K.,Gfall I.,Haba J.,Hara K.,Hara T.,Higuchi T.,Himori S.,Irmler C.,Ishikawa A.,Joo C.,Kah D.H.,Kang K.H.,Kato E.,Kiesling C.,Kodys P.,Kohriki T.,Koike S.,Kvasnicka P.,Marinas C.,Mayekar S.N.,Mibe T.,Mohanty G.B.,Moll A.,Negishi K.,Nakayama H.,Natkaniec Z.,Niebuhr C.,Onuki Y.,Ostrowicz W.,Park H.,Rao K.K.,Ritter M.,Rozanska M.,Saito T.,Sakai K.,Sato N.,Schmid S.,Schnell M.,Shimizu N.,Steininger H.,Tanaka S.,Tanida K.,Taylor G.,Tsuboyama T.,Ueno K.,Uozumi S.,Ushiroda Y.,Valentan M.,Yamamoto H.
Subject
Instrumentation,Nuclear and High Energy Physics
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