Charged particle detection performances of CMOS pixel sensors produced in a <mml:math altimg="si0006.gif" overflow="scroll" xmlns:xocs="http://www.elsevier.com/xml/xocs/dtd" xmlns:xs="http://www.w3.org/2001/XMLSchema" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns="http://www.elsevier.com/xml/ja/dtd" xmlns:ja="http://www.elsevier.com/xml/ja/dtd" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:tb="http://www.elsevier.com/xml/common/table/dtd" xmlns:sb="http://www.elsevier.com/xml/common/struct-bib/dtd" xmlns:ce="http://www.elsevier.com/xml/common/dtd" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:cals="http://www.elsevier.com/xml/common/cals/dtd" xmlns:sa="http://www.elsevier.com/xml/common/struct-aff/dtd"><mml:mn>0.18</mml:mn><mml:mspace width="0.25em"/><mml:mi mathvariant="normal">μ</mml:mi><mml:mi mathvariant="normal">m</mml:mi></mml:math> process with a high resistivity epitaxial layer-Reference-Cited by-同舟云学术

Charged particle detection performances of CMOS pixel sensors produced in a 0.18μm process with a high resistivity epitaxial layer

Published:2013-12 Issue: Volume:730 Page:115-118
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Senyukov S.,Baudot J.,Besson A.,Claus G.,Cousin L.,Dorokhov A.,Dulinski W.,Goffe M.,Hu-Guo C.,Winter M.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference5 articles.

1. L. Musa, Conceptual Design Report for the Upgrade of the ALICE ITS, Technical Report CERN-LHCC-2012-013. LHCC-P-005, CERN, Geneva, 2012.

2. A MAPS based vertex detector for the STAR experiment at RHIC

3. A. Besson, M. Winter, J. Baudot, G. Bertolone, N. Chon-Sen, et al., CMOS sensors with high resistivity epitaxial layer, PoS EPS-HEP2011 (2011) 204.

4. A submicron precision silicon telescope for beam test purposes

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