Beam-test of CMOS pixel sensors with 6GeV electrons-Reference-Cited by-同舟云学术

Beam-test of CMOS pixel sensors with 6GeV electrons

Published:2006-09 Issue:1 Volume:565 Page:119-125
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Contarato D.,Adamus M.,Ciborowski J.,Fretwurst E.,Haas T.,Hauschildt J.,Klanner R.,Kötz U.,Löhr B.,Muhl C.,Polini A.,Sztuk J.,Tyszkiewicz A.,Zeuner W.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference17 articles.

1. A monolithic active pixel sensor for charged particle tracking and imaging using standard VLSI CMOS technology

2. Particle tracking using CMOS monolithic active pixel sensor

3. Monolithic active pixel sensors for a linear collider

4. Test results of monolithic active pixel sensors for charged particle tracking

5. Development of monolithic active pixel sensors for charged particle tracking

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