Extended knife-edge method for characterizing sub-10-nm X-ray beams-Reference-Cited by-同舟云学术

Extended knife-edge method for characterizing sub-10-nm X-ray beams

Published:2010-05 Issue:2-3 Volume:616 Page:246-250
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Handa Soichiro,Kimura Takashi,Mimura Hidekazu,Yumoto Hirokatsu,Matsuyama Satoshi,Sano Yasuhisa,Tamasaku Kenji,Nishino Yoshinori,Yabashi Makina,Ishikawa Tetsuya,Yamauchi Kazuto

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference23 articles.

1. Performance Test of Fresnel Zone Plate with 50 nm Outermost Zone Width in Hard X-ray Region

2. Hard X-ray Diffraction-Limited Nanofocusing with Kirkpatrick-Baez Mirrors

3. Efficient sub 100nm focusing of hard x rays

4. Hard x-ray nanoprobe based on refractive x-ray lenses

5. Efficient focusing of hard x rays to 25nm by a total reflection mirror

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