Micrometry combined with profile mapping for the absolute measurement of Integrated Column Density (ICD) and for accurate X-ray mass attenuation coefficients using XERT-Reference-Cited by-同舟云学术

Micrometry combined with profile mapping for the absolute measurement of Integrated Column Density (ICD) and for accurate X-ray mass attenuation coefficients using XERT

Published:2010-07 Issue:1-3 Volume:619 Page:44-46
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Islam M. Tauhidul,Rae Nicholas A.,Glover Jack L.,Barnea Zwi,Chantler Christopher T.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference9 articles.

1. X-ray attenuation coefficients of carbon in the energy range 5 to 20 keV

2. X-ray attenuation coefficients and photoelectric cross sections of Cu and Fe in the range 3 keV to 29 keV

3. Measurements of the mass attenuation coefficients of tin with characteristic lines from elements excited by energetic protons

4. X-ray extended-range technique for precision measurement of the X-ray mass attenuation coefficient and Im(f) for copper using synchrotron radiation

5. Measurements of the x-ray mass-attenuation coefficient and imaginary component of the form factor of copper

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