Spatial resolution analysis of micron resolution silicon pixel detectors based on beam and laser tests-Reference-Cited by-同舟云学术

Spatial resolution analysis of micron resolution silicon pixel detectors based on beam and laser tests

Published:2009-06 Issue:1-2 Volume:604 Page:385-389
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Andricek Ladislav,Doležal Zdeněk,Drásal Zbyněk,Fischer Peter,Kodyš Peter,Kohrs Robert,Kvasnička Peter,Mariñas Carlos,Reuen Lars,Rummel Stefan,Schmieden Kristof,Velthuis Jaap J.,Vos Marcel

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference6 articles.

1. L. Andricek, DEPFET Collaboration, DEPFET Pixel Vertex Detector for the ILC, October 2007 〈http://hll.mpg.de/twiki/pub/DEPFET/WebHome/backup-master.pdf〉.

2. Spatial resolution of silicon microstrip detectors

3. Z. Drásal, Simulation of charge collection in semiconductor microstrip detectors, Diploma Thesis, Charles University, Prague 2006, available at: 〈http://www.ucjf.troja.mff.cuni.cz/diploma_theses/drasal_dipl.pdf〉.

4. A DEPFET Based Beam Telescope With Submicron Precision Capability

5. Z. Doležal, P. Kvasnička, P. Kodyš et al., DEPFET beam test alignment and resolution analysis, EUDET Memo 2008-10 〈http://www.eudet.org/e26/e28/e615/e757/eudet-memo-2008-10.pdf〉.

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