Residual stress analysis of energy-dispersive diffraction data using a two-detector setup: Part I — Theoretical concept-Reference-Cited by-同舟云学术

Residual stress analysis of energy-dispersive diffraction data using a two-detector setup: Part I — Theoretical concept

Published:2018-01 Issue: Volume:877 Page:24-33
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Apel Daniel,Meixner Matthias,Liehr Alexander,Klaus Manuela,Degener Sebastian,Wagener Guido,Franz Christian,Zinn Wolfgang,Genzel Christoph,Scholtes Berthold

Funder

German Research Foundation

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference42 articles.

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2. Eigenspannungen in Mechanisch Randschichtverformten Werkstoffen. Ursachen, Ermittlung Und Bewertung;Scholtes,1991

3. Structural and Residual Stress Analysis By Nondestructive Methods;Hauk,1997

4. Diffraction Analysis of the Microstructure of Materials;Genzel,2003

5. Stress analysis of polycrystalline thin films and surface regions by X-ray diffraction

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