Radiation hardness test and characterization of a low-noise front-end readout ASIC in 180 nm CMOS technology for space X-ray survey-Reference-Cited by-同舟云学术

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Radiation hardness test and characterization of a low-noise front-end readout ASIC in 180 nm CMOS technology for space X-ray survey

Published:2018-08 Issue: Volume:898 Page:117-124
ISSN:0168-9002
Container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Author:

Gao W.,Li S.,Duan Y.,Li Z.,Yao Y.

Funder

National Natural Science Foundation of China

Shaanxi Natural Science Foundation of China

Major Basic Research Development Program of Shaanxi Province

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference15 articles.

1. The Spectrometer/Telescope for Imaging X-rays on Solar Orbiter: Flight design, challenges and trade-offs

2. Future of Space Astronomy: A global Road Map for the next decades

3. Development of a compact radiation-hardened low-noise front-end readout ASIC for CZT-based hard X-ray imager

4. Drift Time Variations in CdZnTe Detectors Measured With Alpha Particles and Gamma Rays: Their Correlation With Detector Response

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