A solid-state near infrared spectrum analyzer based on polycrystalline Ge on Si-Reference-Cited by-同舟云学术

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A solid-state near infrared spectrum analyzer based on polycrystalline Ge on Si

Published:2000-10 Issue:5-6 Volume:3 Page:545-549
ISSN:1369-8001
Container-title:Materials Science in Semiconductor Processing
language:en
Short-container-title:Materials Science in Semiconductor Processing

Author:

Colace L.,Masini G.,Galluzzi F.,Assanto G.

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference10 articles.

1. Bias controlled amorphous Si/SiC;Caputo;Solid State Phenomena,1995

2. A voltage-controlled tunable two-color infrared photodetector using GaAs/AlAs/GaAlAs and GaAs/GaAlAs stacked multiquantum wells;Zhang;Appl Phys Lett,1996

3. Voltage-tunable far-infrared photodetector with a very large tuning range;Huang;Appl Surf Sci,1996

4. Simple channel monitoring method for fail detection of multiple WOM channels using a wavelength selective detector;Park;Electron Lett,1998

5. Monolithic Inp/InGaAsP/InP grating spectrometer for the 1.48–1.56 μm wavelength range;Soole;Appl Phys Lett,1991

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