Local microwave characterization of metal films using a scanning microwave near-field microscope
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Condensed Matter Physics,General Chemistry
Reference13 articles.
1. Noncontact Technique for the Local Measurement of Semiconductor Resistivity
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3. Temperature-dependent local electromagnetic characterization of electronic materials by scanning microwave near-field technique;Materials Science and Engineering: B;2005-08
4. Quantitative microwave evanescent microscopy of dielectric thin films using a recursive image charge approach;Applied Physics Letters;2004-06-07
5. Spatially resolved characterization of the microwave properties of superconducting thin films by low temperature microwave scanning near-field microscopy;IEEE Transactions on Appiled Superconductivity;2003-06
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