Exposing latent fingermarks on problematic metal surfaces using time of flight secondary ion mass spectroscopy-Reference-Cited by-同舟云学术

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Exposing latent fingermarks on problematic metal surfaces using time of flight secondary ion mass spectroscopy

Published:2018-11 Issue:6 Volume:58 Page:405-414
ISSN:1355-0306
Container-title:Science & Justice
language:en
Short-container-title:Science & Justice

Author:

Thandauthapani Tshaiya Devi,Reeve Adam J.,Long Adam S.,Turner Ian J.,Sharp James S.^ORCID

Funder

University of Derby

UK Home Office

Publisher

Elsevier BV

Subject

Pathology and Forensic Medicine

Reference49 articles.

1. Statistical Bulletin: Crime in England and Wales: Year Ending;Flatley,2017

2. Advances in Fingerprint Technology,2001

3. A methodology for finger mark research;Sears;Sci. Justice,2012

4. Forensic Fingerprints,2016

5. Lee and Gaensslen's Advances in Fingerprint Technology;Ramotowski,2012

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4. Fingermark quality assessment, a transversal study of subjective quality scales;Forensic Science International;2023-09

5. Personal Identification of Fingerprint Donors Based on Time-of-Flight Secondary Ion Mass Spectrometry;CHINESE J ANAL CHEM;2023

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