Image subtraction method for improving lateral resolution and SNR in confocal microscopy-Reference-Cited by-同舟云学术

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Image subtraction method for improving lateral resolution and SNR in confocal microscopy

Published:2013-06 Issue: Volume:48 Page:489-494
ISSN:0030-3992
Container-title:Optics & Laser Technology
language:en
Short-container-title:Optics & Laser Technology

Author:

Wang Yifan,Kuang Cuifang,Gu Zhaotai,Liu Xu

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference21 articles.

1. Scanning tunneling microscopy;Binnig;IBM Journal of Research and Development,2000

2. Atomic force microscope;Binnig;Physical Review Letters,1986

3. Scanning electron microscopy;Unakar;Ophthalmic Research,1981

4. Scanning near-field optical microscopy, scanning probe microscopy: analytical methods;Fischer,1998

5. On Abbe's theory of image formation in the microscope;Köhler;Journal of Modern Optics,1981

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