Automated inspection of micro-defect recognition system for color filter-Reference-Cited by-同舟云学术

Automated inspection of micro-defect recognition system for color filter

Published:2015-07 Issue: Volume:70 Page:6-17
ISSN:0143-8166
Container-title:Optics and Lasers in Engineering
language:en
Short-container-title:Optics and Lasers in Engineering

Author:

Jeffrey Kuo Chung-Feng,Peng Kai-Ching,Wu Han-Cheng,Wang Ching-Chin

Funder

National Science Council of the Republic of China

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference18 articles.

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3. An intelligent defect inspection technique for color filter, ICM ’05;Chang;IEEE Int. Conf. Mech.,2005

4. Defect detection in periodically patterned surfaces using independent component analysis;Tsai;Pattern Recogn,2008

5. NDT capability of digital shearography for different materials;Liu;Opt Lasers Eng,2011

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