Single-shot fringe-pattern analysis algorithm robust against abrupt phase jumps-Reference-Cited by-同舟云学术

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Single-shot fringe-pattern analysis algorithm robust against abrupt phase jumps

Published:2021-04 Issue: Volume:139 Page:106462
ISSN:0143-8166
Container-title:Optics and Lasers in Engineering
language:en
Short-container-title:Optics and Lasers in Engineering

Author:

Lian Songzhe,Kudo Hiroyuki,Wu Yanlin,Momose Atsushi

Funder

Exploratory Research for Advanced Technology

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference23 articles.

1. Schreiber H, Bruning J. Phase shifting interferometry. In: Malacara D, editor. Optical Shop Testing. 3rd ed. John Wiley & Sons; 2007, p. 547–666. ISBN: 978-0-471-48404-2

2. Fourier transform profilometry for the automatic measurement of 3-d object shape;Takeda;Appl Opt,1983

3. Phase-contrast X-ray computed tomography for observing biological soft tissues;Momose;Nat Med,1996

4. Demonstration of X-ray Talbot interferometry;Momose;Jpn J Appl Phys,2003

5. Least-squares estimation in phase-measurement interferometry;Morgan;Opt Lett,1982

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