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Modulo-2pi phase determination from individual ESPI images

  • Published:2012-08 Issue:8 Volume:50 Page:1030-1035
  • ISSN:0143-8166
  • Container-title:Optics and Lasers in Engineering
  • language:en
  • Short-container-title:Optics and Lasers in Engineering

Author:

Georgas Peter J.,Schajer Gary S.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference11 articles.

1. Optical methods in engineering metrology;Williams,1993

2. Speckle metrology;Sirohi.,1993

3. Optical holography: principles, techniques, and applications;Hariharan,1996

4. Optical methods of engineering analysis;Cloud,1998

5. Interferogram analysis for optical testing;Malacara,2005

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