Dispersive parameters for complex refractive index of p- and n-type silicon from spectrophotometric measurements in spectral range 200–2500nm-Reference-Cited by-同舟云学术

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Dispersive parameters for complex refractive index of p- and n-type silicon from spectrophotometric measurements in spectral range 200–2500nm

Published:2015-01 Issue: Volume:65 Page:106-112
ISSN:0030-3992
Container-title:Optics & Laser Technology
language:en
Short-container-title:Optics & Laser Technology

Author:

El-Zaiat El-Sayed Y.,Youssef Gamal M.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference30 articles.

1. Silicon photonics: An introduction;Reed,2004

2. Fundamentals of photonics;Saleh,2007

3. Optical MEMS for light wave communication;Wu;J Lightwave Technol,2006

4. Targets used in the production of radioactive ion beams at the HRIBF;Stracener;Nucl Instrum Methods Phys Res A,2004

5. Practical design and production of optical thin films;Willey,2002

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