Dimensional characterization of opaque samples with a ring interferometer-Reference-Cited by-同舟云学术

Dimensional characterization of opaque samples with a ring interferometer

Published:2009-05 Issue:5 Volume:47 Page:607-611
ISSN:0143-8166
Container-title:Optics and Lasers in Engineering
language:en
Short-container-title:Optics and Lasers in Engineering

Author:

Morel E.N.,Torga J.R.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. Measuring large step heights by variable synthetic wavelength interferometry, Meas;Lu;Sci Technol,2002

2. Wide band interferometry for thickness measurement;Costantino;Opt Express,2003

3. Eneas N. Morel, Jorge R. Torga. Signal processing in Fourier low coherence interferometry. XI Reunión de Trabajo en Procesamiento de la Información y Control, 2005. Trabajos completes. ISBN 950-665-340-2.

4. Common-path interferometer for frequency-domain optical coherence tomography;Andrei;Appl Opt,2003

5. Eneas N. Morel, Jorge R. Torga. Simultaneous measurement of deformation and thickness variation in polymer films. Conference on Interferometry XIII: Applications, SPIE Symposium on Optics and Photonics.

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