Single-shot synthetic wavelength imaging: Sub-mm precision ToF sensing with conventional CMOS sensors-Reference-Cited by-同舟云学术

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Single-shot synthetic wavelength imaging: Sub-mm precision ToF sensing with conventional CMOS sensors

Published:2024-07 Issue: Volume:178 Page:108165
ISSN:0143-8166
Container-title:Optics and Lasers in Engineering
language:en
Short-container-title:Optics and Lasers in Engineering

Author:

Ballester Manuel^ORCID,Wang Heming,Li Jiren,Cossairt Oliver,Willomitzer Florian^ORCID

Publisher

Elsevier BV

Reference72 articles.

1. Automated phase-measuring profilometry of 3-D diffuse objects;Srinivasan;Appl Opt,1984

2. High-speed pattern projection for three-dimensional shape measurement using laser speckles;Schaffer;Appl Opt,2010

3. Fourier transform profilometry for the automatic measurement of 3-D object shapes;Takeda;Appl Opt,1983

4. Structure-from-motion revisited;Schonberger,2016

5. Single-shot: 3D motion picture camera with a dense point cloud;Willomitzer;Opt Express,2017

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